Multicarrier trapping by copper microprecipitates in silicon
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.62.3074/fulltext
Reference13 articles.
1. Copper Precipitation on Dislocations in Silicon
2. Metal Precipitates in Silicon p‐n Junctions
3. Problems related to p-n junctions in silicon
4. Deep‐level transient spectroscopy: A new method to characterize traps in semiconductors
5. Measurement of the grain-boundary states in semiconductors by deep-level transient spectroscopy
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