Damping Mechanism in Dynamic Force Microscopy
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.85.5348/fulltext
Reference14 articles.
1. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity
2. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
3. Observation of $\bf 7\times 7$ Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force Microscopy
4. Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force Microscope
5. Forces and frequency shifts in atomic-resolution dynamic-force microscopy
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