Modeling and Simulation of Dynamic Contact Atomic Force Microscope-Reference-Cited by-同舟云学术

Modeling and Simulation of Dynamic Contact Atomic Force Microscope

Published:2019 Issue: Volume: Page:109-118
ISSN:2195-4356
Container-title:Advances in Mechanical Engineering
language:
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Author:

Bahrami Mohammad Reza,Abeygunawardana A. W. Buddimal

Publisher

Springer International Publishing

Link

http://link.springer.com/content/pdf/10.1007/978-3-030-11981-2_10

Reference16 articles.

1. Binnig G, Quate CF, Geber Ch (1986) Atomic Force Microscope Phys Rev Lett 56(9):930

2. Bahrami MR, Ramezani A, Osgouie K (2010) Modeling and simulation of non-contact atomic force microscope. In: Proceedings of the ASME 2010 10th conference on engineering system design and analysis, ESDA 2010. Vol. 5. pp 565–569

3. Materassi D, Basso M, Genesio R (2004) Frequency analysis of atomic force microscopes with repulsive-attractive interaction potentials. In: Proceedings of IEEE conference on decision and control. pp 3059–3061

4. Sebastian A, Salapaka MV, Chen DJ, Cleveland JP (2003) Harmonic analysis based modeling of tapping-mode AFM. In: Proceedings of American control conference. pp 232–236

5. Wang L (1998) Analytical descriptions of the tapping-mode atomic force microscopy response. Appl Phys Lett 73(25):3781–3783

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