Modeling and Simulation of Tapping Mode Atomic Force Microscope Through a Bond-Graph-Reference-Cited by-同舟云学术

Modeling and Simulation of Tapping Mode Atomic Force Microscope Through a Bond-Graph

Published:2018 Issue: Volume: Page:9-15
ISSN:2195-4356
Container-title:Advances in Mechanical Engineering
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Author:

Bahrami Mohammad Reza,Abeygunawardana A. W. Buddimal

Publisher

Springer International Publishing

Link

http://link.springer.com/content/pdf/10.1007/978-3-319-72929-9_2

Reference13 articles.

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2. Materassi D, Basso M, Genesio R (2004) Frequency analysis of atomic force microscopes with repulsive-attractive interaction potentials. In: Proceedings of IEEE conference on decision and control, pp 3059–3061

3. Sebastian A, Salapaka MV, Chen DJ, Cleveland JP (2003) Harmonic analysis based modeling of tapping-mode AFM. In: Proceedings of American control conference, vol 1, pp 232–236

4. Wang L (1998) Analytical descriptions of the tapping-mode atomic force microscopy response. Appl Phys Lett 73(25):3781–3783

5. Gauthier M, Tsukada M (2000) Damping mechanism in dynamic force microscopy. Phys Rev Lett 85(25):5348–5351

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