Postcoalescence Evolution of Growth Stress in Polycrystalline Films
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.110.056101/fulltext
Reference24 articles.
1. Materials issues in the processing, the operation and the reliability of MEMS
2. Effect of Residual Stress of Thin and Thick Layers on Laser Lifted-Off Light Emitting Diodes
3. Curving Nanostructures Using Extrinsic Stress
4. Compressive Stress in Polycrystalline Volmer-Weber Films
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