Secondary-electron production pathways determined by coincidence electron spectroscopy

Author:

Scheinfein M. R.,Drucker Jeff,Weiss J. K.

Publisher

American Physical Society (APS)

Cited by 31 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Secondary Electron Emission by Plasmon-Induced Symmetry Breaking in Highly Oriented Pyrolytic Graphite;Physical Review Letters;2020-11-06

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3. Surface effects in simulations of scanning electron microscopy images;Metrology, Inspection, and Process Control for Microlithography XXXIII;2019-03-26

4. Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms;Ultramicroscopy;2011-06

5. Energy-Loss Instrumentation;Electron Energy-Loss Spectroscopy in the Electron Microscope;2011

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