Two-dimensional silicide 5×3 structure on Cu(001) as seen by scanning tunneling microscopy and helium-atom scattering
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.50.15304/fulltext
Reference38 articles.
1. Atomic-structure-dependent Schottky barrier at epitaxial Pb/Si(111) interfaces
2. Schottky-barrier behavior of copper and copper silicide onn-type andp-type silicon
3. The copper–silicon interface: Composition and interdiffusion
4. Initial epitaxial growth of copper silicide on Si{111} studied by low‐energy electron microscopy and photoemission electron microscopy
5. AES, LEED and TDS studies of Cu on Si(111)7 × 7 and Si(100)2 × 1
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