Divacancy-tin complexes in electron-irradiated silicon studied by EPR
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.61.2657/fulltext
Reference42 articles.
1. Angular Distributions of (α, n) Reaction son Be and C
2. Negative-U Properties for Point Defects in Silicon
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