Internally consistent approach for modeling solid-state aggregation. II. Mean-field representation of atomistic processes
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.68.045207/fulltext
Reference41 articles.
1. Point Defect Dynamics and the Oxidation‐Induced Stacking‐Fault Ring in Czochralski‐Grown Silicon Crystals
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4. Kinetic model of coherent island formation in the case of self-limiting growth
5. Nucleation and growth in cluster dynamics: A quantitative test of the classical kinetic approach
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