Observation and mechanism of local oxygen reordering induced by high-energy heavy-ion (U+,Au+,Xe+) irradiation in the high-TcsuperconductorYBa2Cu3O7−δ
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.57.6152/fulltext
Reference20 articles.
1. Vortex confinement by columnar defects inYBa2Cu3O7crystals: Enhanced pinning at high fields and temperatures
2. Irradiation Defect Structures In YBa2Cu3O7-xand their Correlation with Superconducting Properties
3. Local Electrodynamics in Heavy Ion IrradiatedBi2Sr2CaCu2O8+δ
4. Modulated structure and local oxygen reordering induced by high-energy Au-ion irradiation in YBa2Cu3O7-
5. Flux-line pinning inBi2Sr2Ca1Cu2Oxcrystals: Interplay of intrinsic 2D behavior and irradiation-induced columnar defects
Cited by 25 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Role of defects in increasing the critical current density of reel-to-reel PLD (Eu,Er)Ba2Cu3Oy+BaHfO3-coated conductors;Japanese Journal of Applied Physics;2024-06-03
2. The variation of pinning efficiency in YBCO films containing columnar defects;Physica C: Superconductivity and its Applications;2022-01
3. Large enhancement of the in-field critical current density of YBCO coated conductors due to composite pinning landscape;Superconductor Science and Technology;2020-11-30
4. Dynamic behavior of reversible oxygen migration in irradiated-annealed high temperature superconducting wires;Scientific Reports;2020-09-10
5. Effect of swift heavy ions irradiation on the microstructure and current-carrying capability in YBa2Cu3O7-δ high temperature superconductor films;Acta Physica Sinica;2020
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3