SiO2/Si interfacial structure on vicinal Si(100) studied with second-harmonic generation
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.47.10389/fulltext
Reference29 articles.
1. Microscopic structure of theSiO2/Si interface
2. Photoemission study of the SiO2/Si interface structure of thin oxide films on Si(100), (111), and (110) surfaces
3. The Si(001)/SiO2 interface
4. Si(001) vicinal surface oxidation in O2: Angle-resolved Si 2p core-level study using synchroton radiation
5. Si→SiO2transformation: Interfacial structure and mechanism
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