In-plane structure of arsenic deposited on the Si(111) surface studied with the grazing-angle x-ray standing-wave method
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.48.11408/fulltext
Reference17 articles.
1. Detection of Foreign Atom Sites by Their X-Ray Fluorescence Scattering
2. X-Ray Standing Waves at Crystal Surfaces
3. Solution to the Surface Registration Problem Using X-Ray Standing Waves
4. Diffraction of evanescent x-rays: Results from a dynamical theory
5. Dynamical Diffraction of X Rays by Perfect Crystals
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