Surface, Thin Film, and Nano Structural Information Obtained Using X-ray Diffraction-Reference-Cited by-同舟云学术

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Surface, Thin Film, and Nano Structural Information Obtained Using X-ray Diffraction

Published:2012 Issue:9 Volume:33 Page:492-500
ISSN:0388-5321
Container-title:Hyomen Kagaku
language:en
Short-container-title:Journal of The Surface Science Society of Japan

Author:

SAKATA Osami¹

Affiliation:

1. National Institute for Materials Science (NIMS), Synchrotron X-ray Station at SPring-8

Publisher

Surface Science Society Japan

Subject

General Earth and Planetary Sciences,General Engineering,General Environmental Science

Reference37 articles.

1. 3) R. Feidenhans'l: Surf. Sci. Rep. 10, 105 (1989).

2. 4) I.K. Robinson: “Surface crystallography” in Handbook on Synchrotron Radiation, Vol. 3 (Elsevier Science Publishers, 1991).

3. 9) O. Sakata, S. Yasui, T. Yamada, M. Yabashi, S. Kimura and H. Funakubo: AIP conference proceedings 1234, 151 (2010).

4. 10) Y. Ehara, S. Yasui, J. Ngata, D. Kan, V. Anbusathaiah, T. Yamada, O. Sakata, H. Funakubo and V. Nagarajan: Appl. Phys. Lett. 99, 182906 (2011).

5. 11) K. Takahashi, M. Suzuki, T. Kojima, T. Watanabe, Y. Sakashita, K. Kato, O. Sakata, K. Sumitani and H. Funakubo: Appl. Phys. Lett. 89, 082901 (2006).

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