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Measuring the reactivity of a silicon-terminated probe

Published:2016-09-30 Issue:11 Volume:94 Page:
ISSN:2469-9950
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Sweetman Adam,Stirling Julian,Jarvis Samuel Paul,Rahe Philipp,Moriarty Philip

Funder

Leverhulme Trust

Engineering and Physical Sciences Research Council

Seventh Framework Programme

Research Executive Agency

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.94.115440/fulltext

Reference37 articles.

1. The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy

2. Intramolecular bonds resolved on a semiconductor surface

3. Imaging Three-Dimensional Surface Objects with Submolecular Resolution by Atomic Force Microscopy

4. Chemical structure imaging of a single molecule by atomic force microscopy at room temperature

5. Role of Covalent Tip-Surface Interactions in Noncontact Atomic Force Microscopy on Reactive Surfaces

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Precise determination of molecular adsorption geometries by room temperature non-contact atomic force microscopy;Communications Chemistry;2024-01-06

2. Intramolecular Force Mapping at Room Temperature;ACS Nano;2023-01-05

3. Alignment method for the accurate and precise quantification of tip-surface forces;Physical Review B;2021-02-05

4. Embedding human heuristics in machine-learning-enabled probe microscopy;Machine Learning: Science and Technology;2020-02-04

5. Tip-induced passivation of dangling bonds on hydrogenated Si(100)-2 × 1;Applied Physics Letters;2017-07-31

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