Imaging Three-Dimensional Surface Objects with Submolecular Resolution by Atomic Force Microscopy-Reference-Cited by-同舟云学术

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Imaging Three-Dimensional Surface Objects with Submolecular Resolution by Atomic Force Microscopy

Published:2015-03-18 Issue:4 Volume:15 Page:2257-2262
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Moreno César¹²,Stetsovych Oleksandr¹³,Shimizu Tomoko K.¹⁴,Custance Oscar¹

Affiliation:

1. National Institute for Materials Science (NIMS), 1-2-1 Sengen, 305-0047 Tsukuba, Ibaraki Japan

2. International Center for Young Scientists, NIMS, 1-2-1 Sengen, 305-0047 Tsukuba, Ibaraki Japan

3. Institute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnicka 10, Prague, Czech Rebublic

4. JST, PRESTO, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan

Funder

Ministry of Education, Culture, Sports, Science, and Technology

National Institute for Materials Science

Kao Corporation

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/nl504182w

Reference36 articles.

1. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy

2. Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork

3. Magnetic exchange force microscopy with atomic resolution

4. Quantitative Measurement of Short-Range Chemical Bonding Forces

5. Atom inlays performed at room temperature using atomic force microscopy

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