Diffuse x-ray scattering from thermal donors in Czochralski-grown silicon
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.56.5228/fulltext
Reference53 articles.
1. Investigation of Interstitials in Electron-Irradiated Aluminum by Diffuse-X-Ray Scattering Experiments
2. Investigation of Frenkel defects in electron irradiated copper by Huang scattering of X-rays. I. Results for single interstitials
3. Diffuse–scattering study of vacancies in quenched gold
4. Diffuse X-ray scattering studies of defect reactions in electron-irradiated dilute nickel alloys. I. Ni-Si
5. Diffuse X-ray scattering from interstitial nitrogen in niobium. I. Huang diffuse scattering
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1. Dynamical theoretical model of the high-resolution double-crystal x-ray diffractometry of imperfect single crystals with microdefects;Physical Review B;2008-12-30
2. X-ray diffraction study of defect distribution in Czochralski grown silicon highly doped by As;Journal of Physics D: Applied Physics;2005-05-06
3. Diffuse x-ray scattering and transmission electron microscopy study of defects in antimony-implanted silicon;Journal of Applied Physics;2004-04-15
4. Bragg Diffraction of X-Rays by Single Crystals with Large Microdefects;physica status solidi (b);2002-05
5. Investigation of Czochralski Silicon Grown with Different Interstitial Oxygen Concentrations and Point Defect Populations;Journal of The Electrochemical Society;2001
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