Low-energy positron diffraction from CdTe(110):mA minimum-variance R-factor analysis
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.55.7181/fulltext
Reference38 articles.
1. Low-energy positron diffraction from the (110) surfaces of GaAs and InP
2. Analysis of the atomic geometries of the (101¯0) and (112¯0) surfaces of CdSe by low-energy-electron diffraction and low-energy-positron diffraction
3. Dependence on ionicity of the (110) surface relaxations of zinc-blende semiconductors
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