Experimental and molecular-dynamics study of the Ar emission mechanism during low-energyAr+bombardment of Cu
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.43.13695/fulltext
Reference11 articles.
1. Anomalous Time-of-Flight Distributions Observed for Argon Implanted in Silicon and Resputtered byAr+-Ion Bombardment
2. Resputtering of low-energy implanted inert gases: An angle-resolved time-of-flight study
3. Energy and angle-resolved studies of neutrals desorbed from ion bombarded polycrystalline metal surfaces
4. Energy distributions of atoms sputtered from polycrystalline surfaces
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