Physics of imagingp−njunctions by scanning tunneling microscopy and spectroscopy
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.67.165307/fulltext
Reference23 articles.
1. Cross-sectional scanning tunnelling microscopy of III-V semiconductor structures
2. Cross-Sectional Scanning Tunneling Microscopy
3. Electrical profiling of Si(001) p‐n junctions by scanning tunneling microscopy
4. Imaging the depletion zone in a Si lateral pn junction with scanning tunneling microscopy
5. Model and simulation of scanning tunneling microscope tip/semiconductor interactions in pn junction delineation
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