Electron trapping in ferroelectric HfO2
Author:
Publisher
American Physical Society (APS)
Subject
Physics and Astronomy (miscellaneous),General Materials Science
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevMaterials.5.034415/fulltext
Reference36 articles.
1. Ferroelectricity in hafnium oxide thin films
2. Ferroelectric Hafnium Oxide Based Materials and Devices: Assessment of Current Status and Future Prospects
3. Stable trapping of electrons and holes in deposited insulating oxides: Al2O3, ZrO2, and HfO2
4. Mechanism of Electron Trapping and Characteristics of Traps in $\hbox{HfO}_{2}$ Gate Stacks
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