Electrodeposition model with dynamic ion diffusion coefficients for predicting void defects in electroformed microcolumn arrays

Author:

Ma Zhigao12,Jiang Bingyan12,Dong Yanzhuo12,Qiang Jun12,Drummer Dietmar3,Zhang Lu12ORCID

Affiliation:

1. School of Mechanical and Electrical Engineering, Central South University, Changsha 410083, China

2. State Key Laboratory of High Performance Complex Manufacturing, Changsha 410083, China

3. Institute of Polymer Technology, Friedrich-Alexander-University Erlangen-Nuremberg, Am Weichselgarten 9, D-91058 Erlangen, Germany

Abstract

Due to the confined mass transfer capability in a microchannel, void defects are easily formed in the electroformed microcolumn array with a high depth/width ratio, which seriously affects the life and performance of micro-devices.

Funder

National Natural Science Foundation of China

Natural Science Foundation of Hunan Province

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

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