Statistics-based electron Moiré technique: a novel method applied to the characterization of mesoporous structures-Reference-Cited by-同舟云学术

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Statistics-based electron Moiré technique: a novel method applied to the characterization of mesoporous structures

Published:2014-09-16 Issue:22 Volume:6 Page:13409-13415
ISSN:2040-3364
Container-title:Nanoscale
language:en
Short-container-title:Nanoscale

Author:

Li Chuanwei,Liu Zhanwei,Xie Huimin,Wu Dan

Funder

National Natural Science Foundation of China

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2014/NR/C4NR03847A

Reference28 articles.

1. WSXM: A software for scanning probe microscopy and a tool for nanotechnology

2. Nanoscale holographic interferometry for strain measurements in electronic devices

3. Silicon-based molecular nanotechnology

4. Probing the Nanoscale

5. Plant nanobionics approach to augment photosynthesis and biochemical sensing

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1. Moiré Fringe Method via Scanning Transmission Electron Microscopy;Small Methods;2021-11-25

2. Point defect detection and strain mapping in Si single crystal by two-dimensional multiplication moiré method;Nanoscale;2021

3. Automatic detection of defect positions including interface dislocations and strain measurement in Ge/Si heterostructure from moiré phase processing of TEM image;Optics and Lasers in Engineering;2020-06

4. Strain Analysis on Electrochemical Failures of Nanoscale Silicon Electrode Based on Three-Dimensional In Situ Measurement;Applied Sciences;2020-01-08

5. Development of Solute-solvent Separation Soft Lithography Grating for Measuring High-temperature In situ Deformation Using Scanning Electron Microscope Moiré Method;Experimental Mechanics;2018-10-08

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