Glow discharge optical emission spectrometry for quantitative depth profiling of CIGS thin-films-Reference-Cited by-同舟云学术

Glow discharge optical emission spectrometry for quantitative depth profiling of CIGS thin-films

Published:2019 Issue:6 Volume:34 Page:1233-1241
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Kodalle Tim¹²³^ORCID,Greiner Dieter¹²³,Brackmann Varvara⁴⁵⁶³,Prietzel Karsten¹²³,Scheu Anja¹²³,Bertram Tobias¹²³,Reyes-Figueroa Pablo¹²³,Unold Thomas¹²³,Abou-Ras Daniel¹²³,Schlatmann Rutger¹²³⁷⁸,Kaufmann Christian A.¹²³,Hoffmann Volker⁴⁵⁶³

Affiliation:

1. Helmholtz-Zentrum Berlin für Materialien und Energie GmbH

2. Berlin

3. Germany

4. IFW Dresden

5. Institute for Complex Materials

6. D-01069 Dresden

7. Hochschule für Technik und Wirtschaft Berlin

8. 10318 Berlin

Abstract

The article demonstrates how quantitative compositional depth profiles of Cu(In,Ga)(S,Se)₂ layers can be utilized to determine their energy bandgap distribution.

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2019/JA/C9JA00075E

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