Performance limit of monolayer MoSi2N4 transistors

Author:

Sun Xiaotian1ORCID,Song Zhigang2ORCID,Huo Nannan1,Liu Shiqi3ORCID,Yang Chen3ORCID,Yang Jie3,Wang Weizhou1ORCID,Lu Jing3456ORCID

Affiliation:

1. College of Chemistry and Chemical Engineering, and Henan Key Laboratory of Function-Oriented Porous Materials, Luoyang Normal University, Luoyang 471934, P. R. China

2. Computational Research Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

3. State Key Laboratory for Mesoscopic Physics and Department of Physics, Peking University, Beijing 100871, P. R. China

4. Collaborative Innovation Center of Quantum Matter, Beijing 100871, P. R. China

5. Beijing Key Laboratory for Magnetoelectric Materials and Devices (BKL-MEMD), Beijing 100871, P. R. China

6. Peking University Yangtze Delta Institute of Optoelectronics Peking University, Nantong 226010, P. R. China

Abstract

The ultra-short gate-length ML MoSi2N4 MOSFET can meet the ITRS requirements with low power dissipation.

Funder

Ministry of Science and Technology of the People's Republic of China

National Natural Science Foundation of China

Publisher

Royal Society of Chemistry (RSC)

Subject

Materials Chemistry,General Chemistry

Reference65 articles.

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5. First-principles study of square phase MX2 and Janus MXY (M=Mo, W; X, Y=S, Se, Te) transition metal dichalcogenide monolayers under biaxial strain

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