Multiple reflection optimization package for X-ray diffraction-Reference-Cited by-同舟云学术

Multiple reflection optimization package for X-ray diffraction

Published:2021 Issue:18 Volume:23 Page:3308-3318
ISSN:1466-8033
Container-title:CrystEngComm
language:en
Short-container-title:CrystEngComm

Author:

Magalhães S.¹²³⁴⁵^ORCID,S. Cabaço J.⁶⁷⁸⁹¹⁰,Araújo J. P.⁶⁷⁸⁹¹⁰,Alves E.¹²³⁴⁵

Affiliation:

1. IPFN, Instituto de Plasmas e Fusão Nuclear

2. Campus Tecnológico e Nuclear

3. Instituto Superior Técnico

4. Universidade de Lisboa

5. 2695-066 Bobadela LRS

6. IFIMUP/IN

7. Instituto de Física dos Materiais da Faculdade de Ciências da Universidade do Porto

8. Instituto de Nanociência e Nanotecnologia

9. 687 4169-007 Porto

10. Portugal

Abstract

New software for the simulation and fitting of 2θ–ω scans of symmetric and asymmetric reflections based on the dynamical theory of X-ray diffraction is presented.

Funder

Instituto Superior Técnico

Universidade do Porto

Publisher

Royal Society of Chemistry (RSC)

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2021/CE/D1CE00204J

Reference68 articles.

1. X-ray diffraction of multilayers and superlattices

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