Impurities in multicrystalline silicon wafers for solar cells detected by synchrotron micro-beam X-ray fluorescence analysis-Reference-Cited by-同舟云学术

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Impurities in multicrystalline silicon wafers for solar cells detected by synchrotron micro-beam X-ray fluorescence analysis

Published:2012 Issue:11 Volume:27 Page:1875
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Buzanich Günter,Radtke Martin,Reinholz Uwe,Riesemeier Heinrich,Thünemann Andreas F.,Streli Christina

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2012/JA/C2JA30188A

Reference32 articles.

1. Multi-element analysis of bread, cheese, fruit and vegetables by double-focusing sector-field inductively coupled plasma mass spectrometry

2. Trace-analytical methods for monitoring contaminations in semiconductor-grade Si manufacturing

3. Determination of trace elements in silicon powder using slurry sampling electrothermal vaporization inductively coupled plasma mass spectrometry

4. Observation of Arsenic Transfer in Leaf Tissue of Hyperaccumulator Fern by Utilizing Synchrotron Radiation Micro-XRF Imaging

5. Application of Confocal 3D Micro-XRF for Solid/Liquid Interface Analysis

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5. Planar PMMA X-ray compound refractive lenses with cascaded parabolic microstructures;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2017-10

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