Determination of trace elements in silicon powder using slurry sampling electrothermal vaporization inductively coupled plasma mass spectrometry
Author:
Publisher
Royal Society of Chemistry (RSC)
Subject
Spectroscopy,Analytical Chemistry
Link
http://pubs.rsc.org/en/content/articlepdf/2011/JA/C0JA00203H
Reference17 articles.
1. Trace and ultratrace analysis of gallium arsenide by different mass spectrometric techniques
2. Trace element analysis of silicon nitride powders by direct solid sampling graphite furnace atomic absorption spectrometry
3. Elemental analysis of silicon based minerals by ultrasonic slurry sampling electrothermal vaporisation ICP-MS
4. Direct determination of impurities in high purity silicon carbide by inductively coupled plasma optical emission spectrometry using slurry nebulization technique
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