Effects of Fe doping on the strain and optical properties of GaN epilayers grown on sapphire substrates

Author:

Zheng C. C.12345,Ning J. Q.4567,Wu Z. P.4567,Wang J. F.893,Zhao D. G.1011912,Xu K.893,Gao J.4567,Xu S. J.4567

Affiliation:

1. Mathematics and Physics Centre

2. Xi'an Jiaotong-Liverpool University

3. Suzhou 215123, China

4. Department of Physics

5. HKU-Shenzhen Institute of Research and Innovation (HKU-SIRI), and HKU-CAS Joint Laboratory on New Materials

6. The University of Hong Kong

7. Hong Kong, China

8. Suzhou Institute of Nano-Tech and Nano-Bionics

9. Chinese Academy of Sciences

10. State Key Laboratory on Integrated Optoelectronics

11. Institute of Semiconductors

12. Beijing 100083, China

Abstract

The effects of Fe doping on a series of Fe-doped GaN epilayers with different doping concentrations grown on sapphire substrates were investigated in detail by confocal micro-Raman spectroscopy under the back-scattering geometric configuration.

Publisher

Royal Society of Chemistry (RSC)

Subject

General Chemical Engineering,General Chemistry

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