Influence of interface properties on charge density, band edge shifts and kinetics of the photoelectrochemical process in p-type NiO photocathodes

Author:

Liu Qian1234,Wei Lifang1234,Yuan Shuai1234,Ren Xin1234,Zhao Yin1234,Wang Zhuyi1234,Zhang Meihong1234,Shi Liyi1234,Li Dongdong56784,Li Aijun9234

Affiliation:

1. Research Center of Nanoscience and Nanotechnology

2. Shanghai University

3. Shanghai 200444

4. China

5. Division of Energy and Environment Research

6. Shanghai Advanced Research Institute

7. Chinese Academy of Sciences

8. Shanghai 201203

9. School of Materials

Abstract

The surface structure of NiO is correlated to observed changes in the band energy, energetic distribution of the trap states density, charge interface transfer, charge transport, and as a result the p-type DSSC device performance.

Funder

Natural Science Foundation of Shanghai

National Natural Science Foundation of China

Publisher

Royal Society of Chemistry (RSC)

Subject

General Chemical Engineering,General Chemistry

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