New observation method for divergent beam X-ray diffraction patterns
Author:
Publisher
Royal Society of Chemistry (RSC)
Subject
Spectroscopy,Analytical Chemistry
Link
http://pubs.rsc.org/en/content/articlepdf/1999/JA/A806922K
Reference7 articles.
1. Kossel diffraction in perfect crystals: X-ray standing waves in reverse
2. New Method for Studying Surface and Interface Structures Using Kossel Lines
3. Laue and Kossel Diffraction on Quasicrystals by Means of Synchrotron Radiation
4. Strain and Precision Lattice Parameter Measurements by the X‐Ray Divergent Beam Method. I
5. D. J. Dingley and N.Razavizadeh, in Scanning Electron Microscopy, ed. O. Johari, AME O. I. L. Hare, Illinois, 1981, vol. IV, p. 287
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