Precise determination of crystal lattice parameters

Abstract

Abstract Precision X-ray methods for absolute and relative determination of crystal lattice parameters (interplanar distances) are described and compared, including the X-ray divergent-beam (Kossel) technique, the Bond method, the Renninger method, the back reflection method, the interference method, and the method of standards. It is shown that for most of the considered methods, a relative accuracy of ∼ 10−5 – 10−6 for determining the lattice parameters is usually achievable, with the last two methods giving a much greater accuracy, at the level of ∼ 10−8 – 10−9 .