Structural and compositional properties of Er-doped silicon nanoclusters/oxides for multilayered photonic devices studied by STEM-EELS-Reference-Cited by-同舟云学术

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Structural and compositional properties of Er-doped silicon nanoclusters/oxides for multilayered photonic devices studied by STEM-EELS

Published:2013 Issue:20 Volume:5 Page:9963
ISSN:2040-3364
Container-title:Nanoscale
language:en
Short-container-title:Nanoscale

Author:

Eljarrat Alberto,López-Conesa Lluís,Rebled José Manuel,Berencén Yonder,Ramírez Joan Manel,Garrido Blas,Magén César,Estradé Sònia,Peiró Francesca

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2013/NR/C3NR02754F

Reference25 articles.

1. Erbium-doped Si nanocrystals: optical properties and electroluminescent devices

2. Excitable Er fraction and quenching phenomena in Er-dopedSiO2layers containing Si nanoclusters

3. Erbium emission in MOS light emitting devices: from energy transfer to direct impact excitation

4. Limit to the erbium ions emission in silicon-rich oxide films by erbium ion clustering

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Er-doped Si-nc/SiO2 multilayer;Advances in Imaging and Electron Physics;2019

2. On the interplay between Si-Er-O segregation and erbium silicate (Er2Si2O7) formation in Er-doped SiOx thin films;Journal of Alloys and Compounds;2018-07

3. Retrieving the electronic properties of silicon nanocrystals embedded in a dielectric matrix by low-loss EELS;Nanoscale;2014

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