Retrieving the electronic properties of silicon nanocrystals embedded in a dielectric matrix by low-loss EELS-Reference-Cited by-同舟云学术

Retrieving the electronic properties of silicon nanocrystals embedded in a dielectric matrix by low-loss EELS

Published:2014 Issue:24 Volume:6 Page:14971-14983
ISSN:2040-3364
Container-title:Nanoscale
language:en
Short-container-title:Nanoscale

Author:

Eljarrat Alberto¹²³⁴,López-Conesa Lluís¹²³⁴,López-Vidrier Julian¹²³⁴,Hernández Sergi¹²³⁴,Garrido Blas¹²³⁴,Magén César⁵⁶⁷⁸⁷,Peiró Francesca¹²³⁴,Estradé Sònia¹²³⁴⁹

Affiliation:

1. MIND-IN2UB

2. Departament d'Electrònica

3. Universitat de Barcelona

4. 08028 Barcelona, Spain

5. Laboratorio de Microscopías Avanzadas (LMA) – Instituto de Nanociencia de Aragón (INA) and Departamento de Física de la Materia Condensada

6. Universidad de Zaragoza

7. 50018 Zaragoza, Spain

8. Fundación ARAID

9. TEM-MAT

Abstract

A novel approach to disentangle the electronic features corresponding to pure Si-NCs from their surrounding dielectric material.

Funder

European Research Council

Consell Catalá de Recerca i Innovació

Agencia Nacional de Promoción Científica y Tecnológica

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2014/NR/C4NR03691C

Reference45 articles.

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