Process temperature-dependent interface quality and Maxwell–Wagner interfacial polarization in atomic layer deposited Al2O3/TiO2 nanolaminates for energy storage applications

Author:

Padhi Partha Sarathi12ORCID,Ajimsha R. S.1,Rai S. K.23,Goutam U. K.4,Bose Aniruddha5,Bhartiya Sushmita6,Misra Pankaj12ORCID

Affiliation:

1. Oxide Nano Electronics Lab., Laser Materials Processing Division, Raja Ramanna Centre for Advanced Technology, Indore 452013, India

2. Homi Bhabha National Institute, Training School Complex, Anushakti Nagar, Mumbai 400094, India

3. Accelerator Physics and Synchrotrons Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore 452013, India

4. Technical Physics Division, Bhabha Atomic Research Centre, Trombay, Mumbai, India

5. SCRF Cavity Characterization and Cryogenics Section, Raja Ramanna Centre for Advanced Technology, Indore 452013, India

6. Nano-Functional Materials Lab., Laser & Functional Materials Division, Raja Ramanna Center for Advanced Technology, Indore-452013, India

Abstract

The dielectric and electrical characteristics of ATA NLs were significantly enhanced owing to a considerable improvement in the conductivity contrast between sublayers and a substantial decrement in impurity/contaminant concentration.

Funder

Homi Bhabha National Institute

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3