Quantifying local thickness and composition in thin films of organic photovoltaic blends by Raman scattering-Reference-Cited by-同舟云学术

Quantifying local thickness and composition in thin films of organic photovoltaic blends by Raman scattering

Published:2017 Issue:29 Volume:5 Page:7270-7282
ISSN:2050-7526
Container-title:Journal of Materials Chemistry C
language:en
Short-container-title:J. Mater. Chem. C

Author:

Rodríguez-Martínez Xabier¹²³^ORCID,Vezie Michelle S.⁴⁵⁶⁷^ORCID,Shi Xingyuan⁴⁵⁶⁷^ORCID,McCulloch Iain⁸⁵⁶⁷⁹^ORCID,Nelson Jenny⁴⁵⁶⁷^ORCID,Goñi Alejandro R.¹²³¹⁰¹¹^ORCID,Campoy-Quiles Mariano¹²³^ORCID

Affiliation:

1. Institut de Ciència de Materials de Barcelona (ICMAB-CSIC)

2. Bellaterra

3. Spain

4. Centre for Plastic Electronics and Department of Physics

5. Imperial College London

6. London SW7 2AZ

7. UK

8. Centre for Plastic Electronics and Department of Chemistry

9. SPERC

10. Institució Catalana de Recerca I Estudis Avançats (ICREA)

11. Barcelona

Abstract

Optical modeling of the Raman-scattered light enables the simultaneous quantification of thickness (d) and volumetric composition (vol%) in multi-component thin films.

Funder

H2020 European Research Council

Engineering and Physical Sciences Research Council

European Cooperation in Science and Technology

Ministerio de Economía y Competitividad

Publisher

Royal Society of Chemistry (RSC)

Subject

Materials Chemistry,General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2017/TC/C7TC01472D

Reference53 articles.