Determination of chemical composition in multilayer polymer film using ToF-SIMS-Reference-Cited by-同舟云学术

Determination of chemical composition in multilayer polymer film using ToF-SIMS

Published:2018 Issue:21 Volume:10 Page:2444-2449
ISSN:1759-9660
Container-title:Analytical Methods
language:en
Short-container-title:Anal. Methods

Author:

Zhou Chuanzhen¹²³⁴^ORCID,Sun Dayong⁵⁶⁷⁴,Garcia Roberto¹²³⁴,Stevie Fred A.¹²³⁴

Affiliation:

1. Analytical Instrumentation Facility

2. North Carolina State University

3. Raleigh

4. USA

5. Analytical Solutions Group

6. Henkel Corporation

7. Bridgewater

Abstract

Time-of-flight secondary ion mass spectrometry is a widely used surface analytical technique, which can provide chemical information from both the uppermost surface and underneath the surface for various materials.

Funder

North Carolina State University

National Science Foundation

Publisher

Royal Society of Chemistry (RSC)

Subject

General Engineering,General Chemical Engineering,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2018/AY/C8AY00344K

Reference20 articles.

1. Thin film polymer photonics: Spin cast distributed Bragg reflectors and chirped polymer structures

2. The path to ubiquitous and low-cost organic electronic appliances on plastic

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5. Facile external treatment for efficient nanoscale morphology control of polymer solar cells using a gas-assisted spray method

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