A comprehensive investigation of MoO3 based resistive random access memory

Author:

Fatheema Jameela12345,Shahid Tauseef678910,Mohammad Mohammad Ali1112513,Islam Amjad14151617,Malik Fouzia1812513,Akinwande Deji19202122,Rizwan Syed12345ORCID

Affiliation:

1. Physics Characterization and Simulations Lab

2. Department of Physics

3. School of Natural Sciences (SNS)

4. National University of Sciences and Technology (NUST)

5. Islamabad 54000

6. CAS Key Laboratory of Magnetic Materials and Application Technology

7. Ningbo Institute of Materials Technology and Engineering

8. Chinese Academy of Sciences

9. Ningbo

10. China

11. School of Chemical and Materials Engineering

12. National University of Sciences & Technology (NUST)

13. Pakistan

14. College of Materials Engineering

15. Fujian Agriculture and Forestry University

16. Fuzhou-350002

17. P. R. China

18. Research Centre for Modelling and Simulations

19. Microelectronics Research Center

20. The University of Texas at Austin

21. Austin

22. USA

Abstract

The bipolar resistive switching of molybdenum oxide is deliberated while molybdenum and nickel are used as bottom and top electrodes, respectively, to present a device with resistive random access memory (RRAM) characteristics.

Funder

Higher Education Commision, Pakistan

National University of Sciences and Technology

Publisher

Royal Society of Chemistry (RSC)

Subject

General Chemical Engineering,General Chemistry

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