Single-photoelectron collection efficiency in 4D ultrafast electron microscopy-Reference-Cited by-同舟云学术

Single-photoelectron collection efficiency in 4D ultrafast electron microscopy

Published:2022 Issue:22 Volume:24 Page:14044-14054
ISSN:1463-9076
Container-title:Physical Chemistry Chemical Physics
language:en
Short-container-title:Phys. Chem. Chem. Phys.

Author:

Curtis Wyatt A.¹²,Willis Simon A.¹²,Flannigan David J.¹²^ORCID

Affiliation:

1. Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Avenue SE, Minneapolis, MN 55455, USA

2. Minnesota Institute for Ultrafast Science, University of Minnesota, Minneapolis, MN 55455, USA

Abstract

With particle tracing simulations, 4D ultrafast electron microscopy (UEM) beam current is found to strongly depend upon basic laser properties and simple electron-gun elements, including laser spot size, photon energy, and Wehnelt aperture diameter.

Funder

Division of Graduate Education

Division of Materials Research

Basic Energy Sciences

American Chemical Society Petroleum Research Fund

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Link

http://pubs.rsc.org/en/content/articlepdf/2022/CP/D2CP01250B

Reference63 articles.

1. Four-dimensional ultrafast electron microscopy

2. Atomic-Scale Imaging in Real and Energy Space Developed in Ultrafast Electron Microscopy

3. Photon-induced near-field electron microscopy

4. Four-Dimensional Electron Microscopy

5. 4D Electron Microscopy: Principles and Applications

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