Layer dependence of out-of-plane electrical conductivity and Seebeck coefficient in continuous mono- to multilayer MoS2 films-Reference-Cited by-同舟云学术

Layer dependence of out-of-plane electrical conductivity and Seebeck coefficient in continuous mono- to multilayer MoS2 films

Published:2021 Issue:47 Volume:9 Page:26896-26903
ISSN:2050-7488
Container-title:Journal of Materials Chemistry A
language:en
Short-container-title:J. Mater. Chem. A

Author:

Lee Won-Yong¹^ORCID,Kang Min-Sung¹^ORCID,Park No-Won¹^ORCID,Kim Gil-Sung¹,Nguyen Anh Duc²,Choi Jae Won¹,Yoon Young-Gui¹^ORCID,Kim Yong Soo²^ORCID,Jang Ho Won³^ORCID,Saitoh Eiji⁴⁵⁶,Lee Sang-Kwon¹^ORCID

Affiliation:

1. Department of Physics, Chung-Ang University, Seoul 06974, Republic of Korea

2. Department of Physics and Energy Harvest-Storage Research Center, University of Ulsan, Ulsan 44610, Republic of Korea

3. Department of Materials Science and Engineering, Seoul National University, Seoul 08826, Republic of Korea

4. Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan

5. WPI Advanced Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan

6. Department of Applied Physics, The University of Tokyo, Tokyo 113-8656, Japan

Abstract

We report on a direct comparison of the out-of-plane thermoelectric properties, such as Seebeck coefficient and electrical conductivity, of atomically thin MoS2 films.

Funder

National Research Foundation of Korea

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science,Renewable Energy, Sustainability and the Environment,General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2021/TA/D1TA07854B

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