Characterization of SiC-grown epitaxial graphene microislands using tip-enhanced Raman spectroscopy
Author:
Affiliation:
1. Department of Chemistry
2. School of Science and Technology
3. Kwansei Gakuin University
4. Sanda
5. Japan
6. Institute of Industrial Science
7. The University of Tokyo
8. Tokyo 153-8505
9. UNISOKU Co. Ltd
10. Hirakata
11. Department of Physics
Abstract
Tip-enhanced Raman spectroscopy of the nanoridge of a graphene island.
Publisher
Royal Society of Chemistry (RSC)
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy
Link
http://pubs.rsc.org/en/content/articlepdf/2015/CP/C5CP05014F
Reference64 articles.
1. Large-Area and High-Quality Epitaxial Graphene on Off-Axis SiC Wafers
2. Towards wafer-size graphene layers by atmospheric pressure graphitization of silicon carbide
3. 4H-SiC(0001) Basal Plane Stability during the Growth of Epitaxial Graphene on Inverted-Mesa Structures
4. Epitaxial Graphene on 4H-SiC(0001) Grown under Nitrogen Flux: Evidence of Low Nitrogen Doping and High Charge Transfer
5. AFM study of ridges in few-layer epitaxial graphene grown on the carbon-face of 4H–SiC
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3. Interactions Between Epitaxial Graphene Grown on the Si- and C-Faces of 4H-SiC Investigated Using Raman Imaging and Tip-Enhanced Raman Scattering;Applied Spectroscopy;2020-08-17
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