Novel 2D binning approach for advanced LIMS depth profiling analysis-Reference-Cited by-同舟云学术

Novel 2D binning approach for advanced LIMS depth profiling analysis

Published:2019 Issue:8 Volume:34 Page:1564-1570
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Riedo Andreas¹²³⁴^ORCID,Grimaudo Valentine⁵⁶⁷⁸^ORCID,Cedeño López Alena⁹¹⁰⁷⁸^ORCID,Tulej Marek⁵⁶⁷⁸^ORCID,Wurz Peter⁵⁶⁷⁸^ORCID,Broekmann Peter⁹¹⁰⁷⁸^ORCID

Affiliation:

1. Sackler Laboratory for Astrophysics

2. Leiden Observatory

3. Leiden University

4. The Netherlands

5. Space Research and Planetary Sciences

6. Physics Institute

7. University of Bern

8. Switzerland

9. Interfacial Electrochemistry Group

10. Department of Chemistry and Biochemistry

Abstract

Novel layer-by-layer ablation protocol for sensitive chemical depth profiling measurements of micrometer-sized samples.

Funder

H2020 Marie Skłodowska-Curie Actions

Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2019/JA/C9JA00138G

Reference32 articles.

1. Depth Profiling and Cross-Sectional Laser Ablation Ionization Mass Spectrometry Studies of Through-Silicon-Vias

2. High depth-resolution laser ablation chemical analysis of additive-assisted Cu electroplating for microchip architectures

3. Capabilities and limitations of LA-ICP-MS for depth resolved analysis of CdTe photovoltaic devices

4. Application of femtosecond laser ablation inductively coupled plasma mass spectrometry for quantitative analysis of thin Cu(In,Ga)Se2 solar cell films

5. Three-dimensional elemental imaging of Li-ion solid-state electrolytes using fs-laser induced breakdown spectroscopy (LIBS)

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