Application of femtosecond laser ablation inductively coupled plasma mass spectrometry for quantitative analysis of thin Cu(In,Ga)Se2 solar cell films-Reference-Cited by-同舟云学术

Application of femtosecond laser ablation inductively coupled plasma mass spectrometry for quantitative analysis of thin Cu(In,Ga)Se2 solar cell films

Published:2015-02 Issue: Volume:577 Page:82-87
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Lee Seokhee,Gonzalez Jhanis J.,Yoo Jong H.,Chirinos Jose R.,Russo Richard E.,Jeong Sungho

Funder

National Research Foundation of Korea (NRF)

Korea government (Ministry of Education, Science, and Technology)

Chemical Science Division, Office of Basic Energy Sciences of the U.S. Department of Energy

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference34 articles.

1. New world record efficiency for Cu(In, Ga)Se2 thin-film solar cells beyond 20%;Jackson;Prog. Photovolt. Res. Appl.,2011

2. CIGS absorbers and processes;Niki;Prog. Photovolt. Res. Appl.,2010

3. Development of thin-film Cu(In, Ga)Se2 and CdTe solar cells;Romeo;Prog. Photovolt. Res. Appl.,2004

4. New technologies for CIGS photovoltaics;Delahoy;Sol. Energy,2004

5. Fabrication of copper–indium–gallium–diselenide absorber layer by quaternary-alloy nanoparticles for solar cell applications;Liu;Sol. Energy,2012

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Numerical Simulation, Preparation, and Evaluation of Cu(In, Ga)Se2 (CIGS) Thin-Film Solar Cells;ChemEngineering;2023-09-15

2. Improved plasma stoichiometry recorded by laser ablation ionization mass spectrometry using a double‐pulse femtosecond laser ablation ion source;Rapid Communications in Mass Spectrometry;2021-04-30

3. Novel 2D binning approach for advanced LIMS depth profiling analysis;Journal of Analytical Atomic Spectrometry;2019

4. Quantitative Analysis and Band Gap Determination for CIGS Absorber Layers Using Surface Techniques;Journal of Analytical Methods in Chemistry;2018-10-18

5. Improvements in the direct analysis of advanced materials using ICP-based measurement techniques;Journal of Analytical Atomic Spectrometry;2017