Capabilities and limitations of LA-ICP-MS for depth resolved analysis of CdTe photovoltaic devices-Reference-Cited by-同舟云学术

Capabilities and limitations of LA-ICP-MS for depth resolved analysis of CdTe photovoltaic devices

Published:2015 Issue:1 Volume:30 Page:191-197
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Gutiérrez-González Ana¹²³⁴,González-Gago Cristina¹²³⁴,Pisonero Jorge¹²³⁴,Tibbetts Nicole⁵⁶⁷,Menéndez Armando⁸⁹⁴,Vélez María¹²³⁴,Bordel Nerea¹²³⁴

Affiliation:

1. Department of Physics

2. University of Oviedo

3. Oviedo

4. Spain

5. General Electric Global Research

6. Niskayuna

7. USA

8. Energy Area (EN) – ITMA Materials Technology (Fundación ITMA)

9. Avilés

Abstract

The analytical potential of ArF* excimer Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS) is investigated for fast qualitative depth profile analysis of multi-layer CdTe photovoltaic (PV) devices.

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2015/JA/C4JA00196F

Reference28 articles.

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4. Determination of the interdiffusion coefficient for the CdS/CdTe heteroestructure by AES sputter depth profiling

5. S and Te inter-diffusion in CdTe/CdS hetero junction

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