On the use of grazing-incidence small-angle X-ray scattering (GISAXS) in the morphological study of ion-implanted materials-Reference-Cited by-同舟云学术

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On the use of grazing-incidence small-angle X-ray scattering (GISAXS) in the morphological study of ion-implanted materials

Published:2004-04-21 Issue:3 Volume:11 Page:272-277
ISSN:0909-0495
Container-title:Journal of Synchrotron Radiation
language:
Short-container-title:J Synchrotron Radiat

Author:

d'Acapito Francesco,Maurizio Chiara,Gonella Francesco,Cattaruzza Elti,Mattei Giovanni,Mondelli Claudia,Longo Alessandro,Martorana Antonino

Publisher

International Union of Crystallography (IUCr)

Subject

Instrumentation,Nuclear and High Energy Physics,Radiation

Link

http://journals.iucr.org/s/issues/2004/03/00/kv5001/kv5001.pdf

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Structure of PbTe(SiO2)/SiO2multilayers deposited on Si(111);Journal of Applied Crystallography;2010-03-26

2. Probing surface and interface morphology with Grazing Incidence Small Angle X-Ray Scattering;Surface Science Reports;2009-08

3. The effect of thermal treatments on the local geometry around indium in In and In+C high dose implanted Si;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-12

4. Grazing incidence small-angle x-ray scattering from defects induced by helium implantation in silicon;Journal of Applied Physics;2006-06

5. Experimental determination of the local geometry around In and In–C complexes in Si;Applied Physics Letters;2006-05-22

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