In situthree-dimensional reciprocal-space mapping during mechanical deformation-Reference-Cited by-同舟云学术

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In situthree-dimensional reciprocal-space mapping during mechanical deformation

Published:2012-07-07 Issue:5 Volume:19 Page:688-694
ISSN:0909-0495
Container-title:Journal of Synchrotron Radiation
language:
Short-container-title:J Synchrotron Radiat

Author:

Cornelius T. W.,Davydok A.,Jacques V. L. R.,Grifone R.,Schülli T.,Richard M.-I.,Beutier G.,Verdier M.,Metzger T. H.,Pietsch U.,Thomas O.

Publisher

International Union of Crystallography (IUCr)

Subject

Instrumentation,Nuclear and High Energy Physics,Radiation

Link

http://journals.iucr.org/s/issues/2012/05/00/fv5003/fv5003.pdf

Reference35 articles.

1. Stress relaxation in highly strained InAs/GaAs structures as studied by finite element analysis and transmission electron microscopy

2. Individual GaAs nanorods imaged by coherent X-ray diffraction

3. Size Dependence of Young’s Modulus in ZnO Nanowires

4. Strained state of Ge(Si) islands on Si: Finite element calculations and comparison to convergent beam electron‐diffraction measurements

5. Nanomechanics of Single Crystalline Tungsten Nanowires

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