Imperfections in (Ga1−xAlxAs)n1–(GaAs)n2/GaAs supperlattices as observed by X-ray diffraction techniques-Reference-Cited by-同舟云学术

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Imperfections in (Ga1−xAlxAs)n1–(GaAs)n2/GaAs supperlattices as observed by X-ray diffraction techniques

Published:1987-04-01 Issue:2 Volume:20 Page:111-116
ISSN:0021-8898
Container-title:Journal of Applied Crystallography
language:
Short-container-title:J Appl Cryst

Author:

Petroff J. F.,Sauvage-Simkin M.,Bensoussan S.,Capelle B.,Auvray P.,Baudet M.

Publisher

International Union of Crystallography (IUCr)

Subject

General Biochemistry, Genetics and Molecular Biology

Link

http://journals.iucr.org/j/issues/1987/02/00/a27725/a27725.pdf

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of GaAs/AlAs multilayer systems for optical Bragg reflectors using x‐ray double crystal techniques;Journal of Applied Physics;1993-03

2. Investigation of Multilayer Systems for Optical Bragg Reflectors by X-ray Double Crystal Topography and - DIF-Fractometry;MRS Proceedings;1991

3. Insight into the genesis of irregularity during crystal growth achieved monochromatic high sensitivity monochromatic synchrotron x-radiation diffraction imaging (topography);Progress in Crystal Growth and Characterization of Materials;1990-01

4. Caractérisation par diffraction X des superréseaux GaAlAs-GaAs. Importance des techniques et de la procédure utilisées;Revue de Physique Appliquée;1989

5. X‐ray and Raman characterization of AlSb/GaSb strained layer superlattices and quasiperiodic Fibonacci lattices;Journal of Applied Physics;1988-12-15

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