Investigation of GaAs/AlAs multilayer systems for optical Bragg reflectors using x‐ray double crystal techniques
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.353125
Reference19 articles.
1. X-ray diffraction study of a one-dimensional GaAs–AlAs superlattice
2. Some aspects of the X-ray structural characterization of (Ga1−xAlxAs)n1(GaAs)n2/GaAs(001) superlattices
3. X‐ray rocking curve analysis of superlattices
4. Improved assessment of structural properties ofAlxGa1−xAs/GaAs heterostructures and superlattices by double-crystal x-ray diffraction
5. Characterization of Ga1−xAlxAs/GaAs superlattices and thin single layers by X-ray diffraction
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1. The reduction of the misfit dislocation in non-doped AlAs/GaAs DBRs;Journal of Crystal Growth;2009-08
2. Investigation of the precision in X-ray diffraction analysis of VCSEL structures;Journal of Materials Science: Materials in Electronics;2003
3. Analysis of Bragg reflectors by lateral photoluminescence spectroscopy;Materials Science and Technology;1998-12
4. Strain compensation in highly carbon doped distributed Bragg reflectors;Journal of Crystal Growth;1997-05
5. Alternating Be and C doping for strain compensated GaAs/AlAs distributed Bragg reflectors;Applied Physics Letters;1997-04-21
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