Structural Dynamics of GaN Microcrystals in Evolutionary Selection Selective Area Growth probed by X-ray Microdiffraction
Author:
Publisher
Springer Science and Business Media LLC
Subject
Multidisciplinary
Link
http://www.nature.com/articles/srep04651.pdf
Reference23 articles.
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4. Geis, M. W., Flanders, D. C. & Smith, H. I. Crystallographic orientation of silicon on an amorphous substrate using an artificial surface-relief grating and laser crystallization. Appl. Phys. Lett. 35, 71–74 (1979).
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