Three-dimensional X-ray structural microscopy with submicrometre resolution
Author:
Publisher
Springer Science and Business Media LLC
Subject
Multidisciplinary
Link
http://www.nature.com/articles/415887a.pdf
Reference30 articles.
1. Wang, Y. et al. A high-throughput x-ray microtomography system at the advanced photon source. Rev. Sci. Instrum. 72, 2062–2068 (2000).
2. Di Fonzo, S. et al. Non-destructive determination of local strain with 100-nanometre spatial resolution. Nature 403, 638–640 (2000).
3. Bilderback, D. H., Hoffman, S. A. & Thiel, D. J. Nanometer spatial-resolution achieved in hard x-ray-imaging and Laue diffraction experiments. Science 263, 201–203 (1994).
4. Yun, W. et al. Nanometer focusing of hard x rays by phase zone plates. Rev. Sci. Instrum. 70, 2238–2241 (1999).
5. Lengeler, B. et al. A microscope for hard x rays based on parabolic compound refractive lenses. Appl. Phys. Lett. 74, 3924–3926 (1999).
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