Large-area integration of two-dimensional materials and their heterostructures by wafer bonding

Author:

Quellmalz ArneORCID,Wang Xiaojing,Sawallich SimonORCID,Uzlu Burkay,Otto MartinORCID,Wagner StefanORCID,Wang ZhenxingORCID,Prechtl MaximilianORCID,Hartwig OliverORCID,Luo Siwei,Duesberg Georg S.ORCID,Lemme Max C.ORCID,Gylfason Kristinn B.,Roxhed NiclasORCID,Stemme Göran,Niklaus FrankORCID

Abstract

AbstractIntegrating two-dimensional (2D) materials into semiconductor manufacturing lines is essential to exploit their material properties in a wide range of application areas. However, current approaches are not compatible with high-volume manufacturing on wafer level. Here, we report a generic methodology for large-area integration of 2D materials by adhesive wafer bonding. Our approach avoids manual handling and uses equipment, processes, and materials that are readily available in large-scale semiconductor manufacturing lines. We demonstrate the transfer of CVD graphene from copper foils (100-mm diameter) and molybdenum disulfide (MoS2) from SiO2/Si chips (centimeter-sized) to silicon wafers (100-mm diameter). Furthermore, we stack graphene with CVD hexagonal boron nitride and MoS2 layers to heterostructures, and fabricate encapsulated field-effect graphene devices, with high carrier mobilities of up to $$4520\;{\mathrm{cm}}^2{\mathrm{V}}^{ - 1}{\mathrm{s}}^{ - 1}$$ 4520 cm 2 V 1 s 1 . Thus, our approach is suited for backend of the line integration of 2D materials on top of integrated circuits, with potential to accelerate progress in electronics, photonics, and sensing.

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy,General Biochemistry, Genetics and Molecular Biology,General Chemistry

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